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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 6 A, 2005, Pages 3932-3935

Antiferromagnetic layer structure effects on exchange coupling strength in ion-beam deposited Ni80Fe20/cobalt oxide bilayers

(3) Lin, Ko Wei a Lin, Fu Tai a Tzeng, Yi Min a

a NATIONAL CHUNG HSING UNIVERSITY (Taiwan)

Author keywords

Exchange bias; Exchange coupling; Ion beam deposition technique; MRAM; NiFe Cobalt oxide bilayers

Indexed keywords

ANTIFERROMAGNETISM; DEPOSITION; ION BEAMS; MULTILAYERS; POLYCRYSTALLINE MATERIALS; THERMAL EFFECTS;

EXCHANGE BIAS; EXCHANGE COUPLING; ION BEAM DEPOSITION TECHNIQUE; MRAM;

NICKEL COMPOUNDS;

EID: 23944511107 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.44.3932 Document Type: Article

Times cited : (1)

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