The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites

Journal of Electron Microscopy

Volumn 54, Issue 2, 2005, Pages 109-117

  Matsuda, Kenji ^b   Ikeno, Susumu ^b   Müllerová, Ilona ^a   Frank, Luděk ^a  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

^b UNIVERSITY OF TOYAMA   (Japan)

Author keywords

Al alloy base ceramic composite; Cathode lens; Low energy electrons; Precipitates in Al Mg Si alloys; Scanning low energy electron microscopy

Indexed keywords

ALUMINA; ALUMINUM OXIDE; CATHODES; ELECTRON ENERGY LEVELS; ELECTRONS; MAGNESIUM ALLOYS; SCANNING ELECTRON MICROSCOPY; SILICON ALLOYS; TOPOGRAPHY;

AL-ALLOY; AL-ALLOY-BASE/CERAMIC COMPOSITE; ALUMINIUM-BASED ALLOY; CATHODE LENS; CERAMIC COMPOSITES; LOW ENERGY ELECTRON MICROSCOPY; LOW ENERGY ELECTRONS; PRECIPITATE IN AL-MG-SI ALLOY; SCANNING LOW ENERGY ELECTRON MICROSCOPY; SUBMICROMETERS;

ALUMINUM ALLOYS;

EID: 23944460618     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/dfi030     Document Type: Article

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