On the role of the signal processing electronics in X-ray analytical measurements

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 219-220, Issue 1-4, 2004, Pages 503-507

  Papp, T ^a,b,c   Maxwell, J A ^b   Papp, A ^a   Nejedly, Z ^b,d   Campbell, J L ^b  

^a Cambridge Scientific   (Canada)

^b UNIVERSITY OF GUELPH   (Canada)

^c INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^d AnZ Solutions   (Canada)

Author keywords

Digital signal processor; DSP; Pileup; Resolution; Throughput rate

Indexed keywords

AMPLIFICATION; ELECTRON TRANSPORT PROPERTIES; RADIATION DETECTORS; SPECTROSCOPIC ANALYSIS; SPURIOUS SIGNAL NOISE; X RAYS;

SIGNAL PROCESSING ELECTRONICS; THROUGHPUT RATE; X RAY SPECTRAL ANALYSTS;

DIGITAL SIGNAL PROCESSING;

EID: 2342466076     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.111     Document Type: Conference Paper

References (7)

1. T. Papp, X-ray Spectrom. (in press).
2. Papp T., Campbell J.L., Varga D., Kalinka G. Nucl. Instr. and Meth. A. 412:1998;109.
3. Campbell J.L., Maxwell J.A., Papp T., White G. X-ray Spectrom. 26:1997;223.
4. Ryan C.G., Heinrich C.A., van Achterberg E., Ballhaus C., Mernagh T.P. Nucl. Instr. and Meth. B. 104:1995;182.
5. Campbell J.L., Teesdale W.J., Maxwell J.A. Nucl. Instr. and Meth. B. 95:1995;407.
6. Mott R.B., Friel J.J. X-ray Spectrometry in Electron Beam Instrumentation. 1995;Plenum Press, New York. p. 127.
7. Newbury D.E. X-ray Spectrometry in Electron Beam Instrumentation. 1995;Plenum Press, New York. p. 127.