Tomographic imaging of nanocrystals by aberration-corrected scanning transmission electron microscopy

Materials Research Society Symposium Proceedings

Volumn 839, Issue , 2005, Pages 3-7

  Van Benthem, Klaus ^a   Peng, Yiping ^a   Pennycook, Stephen J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON BEAMS; GOLD; IMAGING TECHNIQUES; LIGHT SCATTERING; NANOSTRUCTURED MATERIALS; PHOTOMULTIPLIERS; SCANNING ELECTRON MICROSCOPY; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; IMAGE ACQUISITION; NANOCRYSTALS; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

ABERRATIONS;

EID: 23844553805     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. de Rosier, D.J., Klug, A. Reconstruction of Three Dimensional Structures from Electon Micrographs. Nature 217, 130-134 (1968).
2. Midgley, P.A., Weyland, M. 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography. Ultramicroscopy 96, 413-431 (2003).
3. Koster, A.J., Ziese, U., Verkleij, A.J., Janssen, A.H., de Jong, K.P. Three-Dimensional Transmission Electron Microscopy: A Novel Imaging and Characterization Technique with Nanometer Scale Resolution for Materials Science. J. Phys. Chem. B 104, 9368-9370 (2000).
4. Miller, M.K., Atom-Probe Tomography: Analysis at the Atomic level, Kluwer Academic/Plenum Press, New York (2000).
5. K. van Benthem et al., submitted to Nature (2004)
6. http://www.2spi.com/catalog/standards/othertem7.shtml
7. M.J. Hÿtch, W.M. Stobbs, Ultramicroscopy 53 (1994) 191.