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Volumn 36, Issue 9, 2005, Pages 789-800

Standby supply voltage minimization for deep sub-micron SRAM

Author keywords

Data retention; DRV; Leakage suppression; SRAM; State preservation; Variation

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; SENSORS; STANDBY POWER SERVICE; VOLTAGE CONTROL;

EID: 23844470184     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2005.03.003     Document Type: Conference Paper
Times cited : (47)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.