Reflection Z-scan technique for the study of nonlinear refraction and absorption of a single interface and thin film

Journal of the Optical Society of America B: Optical Physics

Volumn 13, Issue 7, 1996, Pages 1491-1498

  Petrov, D V ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85010126703     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.13.001491     Document Type: Article

References (31)

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