Application of RZ-scan technique for investigation of nonlinear refraction of sapphire doped with Ag, Cu, and Au nanoparticles

Optics Communications

Volumn 253, Issue 1-3, 2005, Pages 205-213

  Ganeev, R A ^a,b   Ryasnyansky, A I ^c,d   Stepanov, A L ^e,f   Marques, C ^g,h   Da Silva, R C ^g,h   Alves, E ^g,h  

^a S YU YUNUSOV INSTITUTE OF THE CHEMISTRY OF PLANT SUBSTANCES   (Uzbekistan)

^b UNIVERSITY OF TOKYO   (Japan)

^c SAMARKAND STATE UNIVERSITY   (Uzbekistan)

^d INSTITUT DES NANOSCIENCES DE PARIS   (France)

^e ZAVOISKY PHYSICAL TECHNICAL INSTITUTE   (Russian Federation)

^f UNIVERSITY OF GRAZ   (Austria)

^g INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^h CENTRO DE FÍSICA NUCLEAR DA UNIVERSIDADE DE LISBOA   (Portugal)

Author keywords

Metal nanoparticles; Nonlinear refraction; Reflection Z scan

Indexed keywords

ALUMINUM COMPOUNDS; CHEMICAL LASERS; MATHEMATICAL MODELS; NUCLEATION; PHOTONS; REFRACTIVE INDEX; SAPPHIRE; SURFACE PLASMON RESONANCE;

METAL NANOPARTICLES; NONLINEAR REFRACTION; NONLINEAR SUSCEPTIBILITY; REFLECTION Z-SCAN;

NANOSTRUCTURED MATERIALS;

EID: 23844457597     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.04.061     Document Type: Article

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