Imaging and characterization of γ precipitates in nickel-based superalloys

Proceedings of the International Symposium on Superalloys

Volumn , Issue , 2004, Pages 989-996

  Sarosi, Peter ^a   Viswanathan, Gopal ^a   Whitis, Deborah ^b   Mills, Michael ^a  

^a The Ohio State University   (United States)

^b GE AVIATION   (United States)

Author keywords

EFTEM; Nickel based superalloys; TEM; Volume fraction

Indexed keywords

EFTEM; ELEMENTAL MAPS; ISOTHERMAL AGEING; NICKEL-BASED SUPERALLOYS;

CHARACTERIZATION; CREEP; ELECTRON ENERGY LEVELS; IMAGING SYSTEMS; MICROSTRUCTURE; PRECIPITATION (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; VOLUME FRACTION;

SUPERALLOYS;

EID: 23744513388     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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