Energy calibration and full-pattern refinement for strain analysis using energy-dispersive and monochromatic X-ray diffraction

Journal of Applied Crystallography

Volumn 38, Issue 4, 2005, Pages 661-667

  Liu, J ^a   Kim, K ^a   Golshan, M ^b   Laundy, D ^b   Korsunsky, A M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23744512555     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889805016663     Document Type: Article

References (15)

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