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Volumn 219-220, Issue 1-4, 2004, Pages 246-250
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Random energy loss and straggling study of 9Be ions in silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
BISMUTH;
DATA ACQUISITION;
ELECTRON ENERGY LOSS SPECTROSCOPY;
HELIUM;
HYDROGEN;
KINEMATICS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SILICON;
THIN FILMS;
BOHR'S FORMALISM;
ELASTIC RECOIL DETECTION;
ENERGY STRAGGLING;
SRIM;
ION BEAMS;
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EID: 2342630526
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.01.062 Document Type: Conference Paper |
Times cited : (4)
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References (7)
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