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Volumn 146, Issue 1-4, 1998, Pages 106-113

Universal fit formula for electronic stopping of all ions in carbon and silicon

Author keywords

Electronic stopping power; Ion beams; Ion implantation

Indexed keywords

CARBON; ELECTRON ENERGY LEVELS; ION IMPLANTATION; SILICON; TARGETS;

EID: 0032476989     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00453-4     Document Type: Article
Times cited : (46)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.