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Volumn 146, Issue 1-4, 1998, Pages 106-113
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Universal fit formula for electronic stopping of all ions in carbon and silicon
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Author keywords
Electronic stopping power; Ion beams; Ion implantation
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Indexed keywords
CARBON;
ELECTRON ENERGY LEVELS;
ION IMPLANTATION;
SILICON;
TARGETS;
ATOMIC NUMBER;
ELECTRONIC STOPPING;
ION BEAMS;
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EID: 0032476989
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(98)00453-4 Document Type: Article |
Times cited : (46)
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References (19)
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