FT-IR study on the effect of OH content on the damage process in silica glasses irradiated by hydrogen

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 218, Issue 1-4, 2004, Pages 202-208

  Yoshida, Tomoko ^a   Tanabe, Tetsuo ^a   Hirano, Masahiro ^a   Muto, Shunsuke ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

FT IR; Hydrogen ion irradiation; Silica glass

Indexed keywords

CHEMICAL BONDS; COMPLEXATION; CRYSTAL DEFECTS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN; IRRADIATION; ISOTOPES;

FT-IR; HYDROGEN ION IRRADIATION; HYDROGEN TERMINATION; NETWORK STRUCTURE;

FUSED SILICA;

EID: 2342599039     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2003.12.056     Document Type: Conference Paper

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