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Volumn 219-220, Issue 1-4, 2004, Pages 891-896

Ion beam analysis of epitaxial (Mg, Cd)xZn1-xO and ZnO:(Li, Al, Ga, Sb) thin films grown on c -plane sapphire

Author keywords

Crystalline quality; Elemental composition; Thin films; Zinc oxide

Indexed keywords

ALLOYING; DEGRADATION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; EPITAXIAL GROWTH; ION BEAMS; PHONONS; PULSED LASER DEPOSITION; X RAYS; ZINC OXIDE;

EID: 2342565027     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.183     Document Type: Conference Paper
Times cited : (17)

References (12)
  • 12
    • 2342539378 scopus 로고
    • Diploma Thesis, Universität Leipzig
    • R. Schleitzer, Diploma Thesis, Universität Leipzig, 1994.
    • (1994)
    • Schleitzer, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.