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Volumn 219-220, Issue 1-4, 2004, Pages 891-896
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Ion beam analysis of epitaxial (Mg, Cd)xZn1-xO and ZnO:(Li, Al, Ga, Sb) thin films grown on c -plane sapphire
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Author keywords
Crystalline quality; Elemental composition; Thin films; Zinc oxide
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Indexed keywords
ALLOYING;
DEGRADATION;
DOPING (ADDITIVES);
ELECTRIC CONDUCTIVITY;
EPITAXIAL GROWTH;
ION BEAMS;
PHONONS;
PULSED LASER DEPOSITION;
X RAYS;
ZINC OXIDE;
CRYSTALLINE QUALITY;
ELEMENTAL COMPOSITION;
OPTICAL PHONON MODES;
THIN FILMS;
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EID: 2342565027
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.01.183 Document Type: Conference Paper |
Times cited : (17)
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References (12)
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