Copper (II) adsorbed on SiO2/SnO2 obtained by the sol-gel processing method: Application as electrochemical sensor for ascorbic acid

Journal of Colloid and Interface Science

Volumn 274, Issue 2, 2004, Pages 579-586

  Kurihara, Lincoln A ^a   Fujiwara, Sergio T ^a   Alfaya, Rení V S ^b   Gushikem, Yoshitaka ^a   Alfaya, Antonio A S ^b   De Castro, Sandra C ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b STATE UNIVERSITY OF LONDRINA   (Brazil)

Author keywords

Ascorbic acid; Br nsted and Lewis acid sites; SiO2 SnO2 mixed oxide; SiO2 SnO2 thermal stability; Sol gel method

Indexed keywords

CELL IMMOBILIZATION; COMPOSITION; CONDUCTIVE MATERIALS; COPPER; CRYSTALLINE MATERIALS; ELECTRODES; POROSITY; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROCHEMICAL DETECTION; PRECURSOR REAGENTS; SPECIFIC SURFACE AREA;

SOL-GELS;

ASCORBIC ACID; COPPER; CRYSTALLIN; OXIDE; PYRIDINE; REAGENT; SILICATE; SILICON DIOXIDE; TETRAETHOXYSILANE; TIN; UNCLASSIFIED DRUG;

ACCURACY; ADSORPTION KINETICS; ARTICLE; CHANNEL GATING; CONDUCTANCE; CRYSTALLIZATION; ELECTROCHEMISTRY; ELECTRONIC SENSOR; GEL; HEATING; IMMOBILIZATION; MOLECULAR INTERACTION; MOLECULAR PROBE; PRIORITY JOURNAL; SAMPLING; SOL GEL PROCESSING; SURFACE PROPERTY; SYNTHESIS; TABLET; TECHNIQUE; THERMODYNAMICS; THERMOSTABILITY; X RAY PHOTOELECTRON SPECTROSCOPY;

ASCORBIC ACID; COPPER; ELECTROCHEMISTRY; ELECTRON PROBE MICROANALYSIS; HEAT; MODELS, CHEMICAL; PHASE TRANSITION; SILANES; SILICON DIOXIDE; THERMOGRAVIMETRY; TIME FACTORS; TIN COMPOUNDS; X-RAY DIFFRACTION;

EID: 2342557034     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2004.01.040     Document Type: Article

References (45)

1. Silva R.B., Collins C.H. J. Chromatogr. A. 845:1999;417
2. Melo L.F.C., Jardim I.C.S.F. J. Chromatogr. A. 845:1999;423
3. Silva R.B., Collins K.E., Collins C.H. J. Chromatogr. A. 869:2000;137
4. Melo L.F.C., Collins C.H., Collins K.E., Jardim I.C.S.F. J. Chromatogr. A. 869:2000;129
5. Silva R.B., Gushikem Y., Collins C.H. J. Sep. Sci. 24:2001;1
6. Fujiwara S.T., Gushikem Y., Alfaya R.V.S. Colloids Surf. A. 178:2001;135
7. Perez E.F., Neto G.D., Kubota L.T. Sens. Actuators B. 72:2001;80
8. Rosatto S.S., Kubota L.T., Neto G.D. Anal. Chim. Acta. 390:1999;65
9. Kubota L.T., Gushikem Y., Perez J., Tanaka A.A. Langmuir. 11:1995;1009
10. Gushikem Y., Peixoto C.R.M., Rodrigues Filho U.P., Kubota L.T., Stadler E. J. Colloid Interface Sci. 184:1996;236
11. Zaldivar G.A.P., Gushikem Y., Kubota L.T. J. Electroanal. Chem. 318:1991;247
12. Zaldivar G.A.P., Gushikem Y. J. Electroanal. Chem. 337:1992;165
13. Zaldivar G.A.P., Gushikem Y., Benvenutti E.V., de Castro S.C., Vasquez A. Electrochim. Acta. 39:1994;33
14. Gushikem Y., Rosatto S.S. J. Braz. Chem. Soc. 12:2001;695
15. Alfaya A.A.S., Gushikem Y., de Castro S.C. Chem. Mater. 10:1998;909
16. Walcarius A. Electroanalysis. 10:1998;1217
17. Walcarius A. Chem. Mater. 13:2001;3351
18. Walcarius A. Electroanalysis. 13:2001;701
19. Sano A., Kuwayama T., Furukawa M., Takitani S., Nakamura H. Anal. Sci. 11:1995;405
20. Moeller T., Edwards D.C. Bailar J.C. Jr. Inorganic Syntheses. 1953;119 McGraw-Hill, London
21. Webb P.A., Orr C. Analytical Methods in Fine Particle Technology. 1997;Micromeritics Instrument Corp. Norcross. p. 71
22. Horvath G., Kawazoe K. J. Chem. Eng. Jpn. 16:1983;470
23. Swift P. Surf. Interface Anal. 4:1982;47
24. Scofied J.H. J. Electron Spectrosc. Relat. Phenom. 8:1976;129
25. Powell C. J. Surf. Sci. 44:1974;29
26. Goodhew P.J., Humpheys F.J. Electron Microscopy and Analysis. second ed. 1988;Taylor & Francis, London
27. Moulder J.F., Stickle W.F., Sobol P.E., Bomben K.D. Chastain J. Handbook of X-ray Photoelectron Spectroscopy. 1992;126 Perkin-Elmer Corporation, Physical Electronics Division, Eden Prairie
28. Themlin J.M., Chtaib M., Henrard L., Lambin P., Darville J., Gilles J.M. Phys. Rev. B Condens. Matter Mater. Phys. 46:1992;2460
29. Jimenez V.M., Mejias J.A., Espinos J.P., Gonzalez-Elipe A.R. Surf. Sci. 366:1996;545
30. Carturan G., Ceccato R., Principi G., Russo U. J. Radioanal. Nucl. Chem. 190:1995;419
31. Brinker C.J., Schere G.W. Sol-Gel Science: The Physics and Chemistry of Sol-Gel Processing. 1990;Academic Press, San Diego
32. JCPDS - International Centre for Diffraction Data, PCPDFWIN, version 1.30, 1997
33. Kawano Y., Denofre S., Gushikem Y. Vib. Spectrosc. 7:1994;293
34. Orel B., Lavrencic-Stangar U., Crnjak-Orel Z., Bukovec P., Kosec M. J. Non-Cryst. Solids. 167:1994;272
35. Yu B., Guo L., Yang Z., Zhu C., Gan F., Zhang G., Tang G., Wu X., Chen W. Phys. Lett. A. 251:1999;67
36. Parry E.P. J. Catal. 2:1963;371
37. Benvenutti E.V., Guhikem Y., Davanzo C.U., de Castro S.C., Torriani I.L. J. Chem. Soc. Faraday Trans. 88:1992;3193
38. Morterra C., Cerrato G. Langmuir. 6:1990;1810
39. Tanabe K., Misono M., Ono Y., Hattori H. Delmon B., Yates J.T. New Solid Acids and Bases - Their Catalytic Properties. 1989;Kodansha-Elsevier, Tokyo
40. Ivaska A., Gao Z., Zha T., Wang G., Li P., Zhao Z. Talanta. 40:1993;399
41. Mushran S.P., Agrawal M.C. J. Sci. Ind. Res. India. 36:1977;274
42. Bard A.J., Faulkner L.R. Electroanalytical Chemistry. 1982;Dekker, New York. p. 53
43. Pessoa C.A., Gushikem Y., Kubota L.T., Gorton L. J. Electroanal. Chem. 431:1997;23
44. Pessoa C.A., Gushikem Y., Kubota L.T. Electroanalysis. 9:1997;800
45. Lindquist J. Analyst. 100:1975;339