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Volumn , Issue , 2004, Pages 424-430

Modeling reliability growth in the product design process

Author keywords

Goal reliability; Integrated reliability engineering; Product design; Reliability growth

Indexed keywords

COMPUTER SOFTWARE; COST EFFECTIVENESS; INDUSTRIAL MANAGEMENT; LIFE CYCLE; PROBABILITY; PROBLEM SOLVING; PRODUCT DESIGN; PRODUCT DEVELOPMENT; PROJECT MANAGEMENT; RANDOM PROCESSES; STATISTICAL METHODS; SYSTEMS ANALYSIS; DESIGN; MAINTAINABILITY; QUALITY CONTROL; RELIABILITY; RELIABILITY ANALYSIS;

EID: 2342531670     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (17)

References (8)
  • 2
    • 0021430232 scopus 로고
    • General framework for learning curve reliability growth models
    • Jewell, W (1984) General framework for learning curve reliability growth models, Operations Research, 32, pp 547-558.
    • (1984) Operations Research , vol.32 , pp. 547-558
    • Jewell, W.1
  • 4
    • 0000350596 scopus 로고
    • Bayesian analysis of a commonly used model for describing software failures
    • Meinhold, R and Singpurwalla, ND (1983) Bayesian Analysis of a Commonly Used Model for Describing Software Failures, The Statistician, 32, pp 168-173.
    • (1983) The Statistician , vol.32 , pp. 168-173
    • Meinhold, R.1    Singpurwalla, N.D.2
  • 6
    • 0043175367 scopus 로고    scopus 로고
    • Confidence intervals for reliability growth models with small sample sizes
    • to appear
    • Quigley J and Walls L.A., (2003) Confidence Intervals for Reliability Growth Models with Small Sample Sizes, to appear in IEEE Transactions in Reliability.
    • (2003) IEEE Transactions in Reliability
    • Quigley, J.1    Walls, L.A.2
  • 8
    • 0035501181 scopus 로고    scopus 로고
    • Building prior distributions to support bayesian reliability growth modelling using expert judgement
    • Walls L.A. and Quigley J (2001) Building Prior Distributions to Support Bayesian Reliability Growth Modelling Using Expert Judgement, Reliability Engineering and System Safety, 74, pp 117-128.
    • (2001) Reliability Engineering and System Safety , vol.74 , pp. 117-128
    • Walls, L.A.1    Quigley, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.