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Volumn 15, Issue 2, 1999, Pages 87-93

Measuring the effectiveness of reliability growth testing

Author keywords

[No Author keywords available]

Indexed keywords

DECISION THEORY; FAILURE ANALYSIS; MATHEMATICAL MODELS; STATISTICAL METHODS;

EID: 0032635085     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1638(199903/04)15:2<87::AID-QRE234>3.0.CO;2-Y     Document Type: Article
Times cited : (20)

References (16)
  • 2
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    • Learning curve approach to reliability monitoring
    • J. T. Duane, 'Learning curve approach to reliability monitoring', IEEE Trans. Aerosp., AES-2, 563-566 (1964).
    • (1964) IEEE Trans. Aerosp. , vol.AES-2 , pp. 563-566
    • Duane, J.T.1
  • 3
    • 0001782167 scopus 로고
    • Reliability analysis of complex repairable systems
    • F. Proschan and R. J. Serfling (eds), SIAM, Philadelphia, PA
    • L. H. Crow, 'Reliability analysis of complex repairable systems', in F. Proschan and R. J. Serfling (eds), Reliability and Biometry, SIAM, Philadelphia, PA, pp. 379-410, 1974.
    • (1974) Reliability and Biometry , pp. 379-410
    • Crow, L.H.1
  • 4
    • 0021430232 scopus 로고
    • A general framework for learning curve reliability growth models
    • W. Jewell, 'A general framework for learning curve reliability growth models', Oper. Res., 32(3), 547-558 (1984).
    • (1984) Oper. Res. , vol.32 , Issue.3 , pp. 547-558
    • Jewell, W.1
  • 5
    • 0042358407 scopus 로고
    • A new nonparametric growth model
    • D. Robinson and D. Deitrich, 'A new nonparametric growth model', IEEE Trans. Reliab., REL-36, 411-418 (1987).
    • (1987) IEEE Trans. Reliab. , vol.REL-36 , pp. 411-418
    • Robinson, D.1    Deitrich, D.2
  • 6
    • 0024912382 scopus 로고
    • A non-parametric-Bayes reliability growth model
    • D. Robinson and D. Deitrich, 'A non-parametric-Bayes reliability growth model', IEEE Trans. Reliab., REL-38, 591-598 (1989).
    • (1989) IEEE Trans. Reliab. , vol.REL-38 , pp. 591-598
    • Robinson, D.1    Deitrich, D.2
  • 7
    • 0030104112 scopus 로고    scopus 로고
    • How to model reliability growth when times of design modifications are known
    • N. Ebrahimi, 'How to model reliability growth when times of design modifications are known', IEEE Trans. Reliab., REL-45,45-58 (1996).
    • (1996) IEEE Trans. Reliab. , vol.REL-45 , pp. 45-58
    • Ebrahimi, N.1
  • 9
    • 0026834418 scopus 로고
    • Reliability-growth myths and methodologies -a critical view
    • M. A. Meth, 'Reliability-growth myths and methodologies -a critical view', Proc. Reliability and Maintainability Symp., 1992, pp. 337-342.
    • (1992) Proc. Reliability and Maintainability Symp. , pp. 337-342
    • Meth, M.A.1
  • 13
    • 0000350596 scopus 로고
    • Bayesian analysis of a commonly used mode, for describing software failures
    • R. Meinhold and N. Singpurwalla, 'Bayesian analysis of a commonly used mode, for describing software failures', Statistician, 32, 168-173 (1983).
    • (1983) Statistician , vol.32 , pp. 168-173
    • Meinhold, R.1    Singpurwalla, N.2
  • 14
    • 0041356662 scopus 로고    scopus 로고
    • Practical issues concerning the elicitation of prior distributions for Bayesian reliability growth models
    • J. Quigley, L. Walls, E. MacArthur and J. Marshall, 'Practical issues concerning the elicitation of prior distributions for Bayesian reliability growth models', Proc. 13th ARTS, 1996.
    • (1996) Proc. 13th ARTS
    • Quigley, J.1    Walls, L.2    MacArthur, E.3    Marshall, J.4
  • 15
    • 0345532022 scopus 로고
    • Confidence interval procedures for the Weibull process with applications to reliability growth
    • L. H. Crow, 'Confidence interval procedures for the Weibull process with applications to reliability growth', Technometrics, 23, 251-256 (1982).
    • (1982) Technometrics , vol.23 , pp. 251-256
    • Crow, L.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.