Confidence intervals for reliability-growth models with small sample-sizes

IEEE Transactions on Reliability

Volumn 52, Issue 2, 2003, Pages 257-262

  Quigley, John ^a   Walls, Lesley ^a  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

Order statistics; Reliability growth model; S confidence interval

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; PARAMETER ESTIMATION; POISSON DISTRIBUTION; PROBABILITY DENSITY FUNCTION; RANDOM PROCESSES;

CONFIDENCE INTERVALS; ORDER STATISTICS; RELIABILITY-GROWTH MODELS;

RELIABILITY;

EID: 0043175367     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2003.811865     Document Type: Article

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