ISFET drawbacks minimization using a novel electronic compensation

Sensors and Actuators, B: Chemical

Volumn 99, Issue 1, 2004, Pages 42-49

  Casans, Silivia ^a   Muñoz, Diego Ramírez ^a   Navarro, A Edith ^a   Salazar, A ^b  

^a UNIVERSITY OF VALENCIA   (Spain)

^b Universidad de Oriente   (Spain)

Author keywords

Compensation methods; Electronic conditioning; Hysteresis; Instrumentation systems; ISFET; Long term drift

Indexed keywords

ALGORITHMS; COMPUTER SOFTWARE; DATA ACQUISITION; ELECTRIC VARIABLES MEASUREMENT; GATES (TRANSISTOR); HYSTERESIS; ION SELECTIVE MEMBRANES; SENSORS;

COMPENSATION METHODS; ELECTRONIC CONDITION; INSTRUMENTATION SYSTEMS; LONG-TERM DRIFTS; THERMAL DRIFTS;

ION SENSITIVE FIELD EFFECT TRANSISTORS;

EID: 2342501851     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2003.09.015     Document Type: Article

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