Initial oxidation of fractured surfaces of FeS2(1 0 0) by molecular oxygen, water vapor, and air

Surface Science

Volumn 558, Issue 1-3, 2004, Pages 80-88

  Kendelewicz, T ^a   Doyle, C S ^a   Bostick, B C ^b   Brown Jr , G E ^a,c  

^a STANFORD UNIVERSITY   (United States)

^b Dartmouth College   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

Oxidation; Sulphides; X ray photoelectron spectroscopy

Indexed keywords

AIR; DECOMPOSITION; FRACTURE; OXIDATION; OXYGEN; PARTIAL PRESSURE; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY; SOILS; SULFIDE MINERALS; SURFACE CHEMISTRY; SURFACE REACTIONS; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ACIDIFICATION; BULK CRYSTAL QUALITY; REACTION PRODUCTS; SURFACE PREPARATION;

PYRITES;

EID: 2342483670     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.03.045     Document Type: Article

References (23)

1. Evangelou V., Zhang Y. Crit. Rev. Environ. Sci. Technol. 25:1995;141.
2. Jambor J.I., Nordstrom D.K., Alpers C.N. Rev. Mineral. 40:2000;303.
3. Moses C., Nordstrom D.K., Herman J., Mills A. Geochim. Cosmochim. Acta. 51:1987;1561.
4. Nordstrom D.K., Alpers C.N., Ptacek C.J., Blowes D.W. Environ. Sci. Technol. 34:2000;254.
5. Rimstidt J.D., Vaughan D.J. Geochim. Cosmochim. Acta. 67:2003;873.
6. Zhang Y., Evangelou V. Soil Sci. 161:1996;852.
7. Nesbitt H.W., Bancroft G.M., Pratt A.R., Scaini M.J. Am. Mineral. 83:1998;1067.
8. Nesbitt H.W., Scaini M., Hochst H., Bancroft G.M., Schaufuss A.G., Szargan R. Am. Mineral. 85:2000;850.
9. Chaturvedi S., Katz R., Guevremont J., Schoonen M.A.A., Strongin D.R. Am. Mineral. 81:1996;261.
10. Schaufuss A.G., Nesbitt H.W., Kartio I., Laajalehto K., Bancroft G.M., Szargan R. J. Electron Spectrosc. Relat. Phenom. 96:1998;69.
11. Pettenkofer C., Jaegermann W., Bronold M. Ber. Bunsen-Ges. Phys. Chem. 95:1991;560.
12. Bronold M., Tomm Y., Jaegermann W. Surf. Sci. 314:1994;L931.
13. Lindberg B.J., Harmin K., Johansson G., Gelius U., Fahlman A., Nordling C., Siegbahn K. Phys. Scr. 1:1970;286.
14. Available from 〈http://srdata.nist.gov/xps〉.
15. Guevremont J.M., Bebie J., Elsetinow A.R., Strongin D.R., Schoonen M.A.A. Environ. Sci. Technol. 32:1998;3743.
16. Mönch W. Semiconductor Surfaces and Interfaces. 1993;Springer- Verlag, Berlin.
17. Bessolov V., Lebedev M. Semiconductors. 32:1998;1141.
18. Zahn D.R.T., Kampen T.U., Hohenecker S., Bra W. Vacuum. 57:2000;139.
19. Hung A., Muscat J., Yarovsky I., Russo S.P. Surf. Sci. 513:2002;511.
20. Stirling A., Bernasconi M., Parrinello M. J. Chem. Phys. 118:2003;8917.
21. Rosso K.M., Becker U., Hochella M.F. Jr. Am. Mineral. 84:1999;1549.
22. Reedy B.J., Beattie J.K., Lowson R.T. Geochim. Cosmochim. Acta. 55:1991;1609.
23. Taylor B.E., Wheeler M.C., Nordstrom D.K. Geochim. Cosmochim. Acta. 48:1984;2669.