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Applied Physics Letters

Volumn 84, Issue 15, 2004, Pages 2889-2891

Vertically aligned conductive carbon nanotube junctions and arrays for device applications

(6) Biswas, Sujit K a Vajtai, Robert a Wei, Bingqing a,b Meng, Guowen a Schowalter, Leo J a Ajayan, Pulickel M a

a RENSSELAER POLYTECHNIC INSTITUTE (United States)

b LOUISIANA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE JUNCTIONS; MULTIPLE CHANNELS; MULTIWALLED NANOTUBES; SCANNING SURFACE POTENTIAL MICROSCOPY (SSPM);

ALUMINA; ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CHARGE; ELECTRIC CONTACTS; ELECTRIC POTENTIAL; ELECTRON TRANSPORT PROPERTIES; SEMICONDUCTOR JUNCTIONS; STRESS ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBES;

EID: 2342452567 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1702130 Document Type: Article

Times cited : (9)

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