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Volumn 34, Issue 7, 2005, Pages 1089-1094

Fabrication and thermal evaluation of silicon on diamond wafers

Author keywords

Diamond; Silicon; Silicon on insulator (SOI); Thermal

Indexed keywords

DIAMOND FILMS; DIAMONDS; ELECTRIC VARIABLES MEASUREMENT; ELECTRONIC EQUIPMENT; INTEGRATED CIRCUITS; NUCLEATION; SILICON; SINGLE CRYSTALS; THERMAL CONDUCTIVITY;

EID: 23244443953     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-005-0100-y     Document Type: Article
Times cited : (2)

References (19)
  • 6
    • 0026154321 scopus 로고
    • Piscataway, NJ: IEEE
    • M.W. Geis, Proc. IEEE (Piscataway, NJ: IEEE, 1991), vol. 79, pp. 669-675.
    • (1991) Proc. IEEE , vol.79 , pp. 669-675
    • Geis, M.W.1
  • 13
    • 23244466342 scopus 로고    scopus 로고
    • Ph.D. thesis, North Carolina State University
    • N. Govindaraju (Ph.D. thesis, North Carolina State University, 2004).
    • (2004)
    • Govindaraju, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.