In-plane optical anisotropy of quantum well structures: From fundamental considerations to interface characterization and optoelectronic engineering

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 4, 2000, Pages 2232-2241

  Cortez, S ^a   Krebs, O ^a   Voisin, P ^a  

^a ECOLE NORMALE SUPÉRIEURE   (France)

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EID: 23044521925     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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