Scanning vector Hall probe microscopy

Journal of Magnetism and Magnetic Materials

Volumn 272-276, Issue III, 2004, Pages 2141-2143

  Cambel, V ^a   Gregusova D ^a   Fedor, J ^a   Kudela R ^a   Bending, S J ^b  

^a INSTITUTE OF ELECTRICAL ENGINEERING   (Slovakia)

^b University of Bath   (United Kingdom)

Author keywords

Hall probe; Magnetic microscope

Indexed keywords

CRYOSTATS; DATA REDUCTION; HALL EFFECT; MAGNETIC FIELDS; MICROMACHINING; SEMICONDUCTING GALLIUM ARSENIDE; SENSORS;

FIELD RESOLUTION; HALL PROBES; HALL SENSORS; MAGNETIC MICROSCOPES;

SCANNING;

EID: 23044508484     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2003.12.865     Document Type: Conference Paper

References (4)

1. E. Zeldov, et al., Nature 375 (1995) 373.
2. A. Geim, et al., Nature 396 (1998) 144.
3. A. Oral, et al., J. Vac. Sci. Technol. B 14 (1996) 1202.
4. S. Kicin, et al., J. Appl. Phys. 91 (2002) 878.