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Volumn 76, Issue 7, 2005, Pages 1092-1099

Analysis of failed commercially pure titanium dental implants: A scanning electron microscopy and energy-dispersive spectrometer X-ray study

Author keywords

Comparison studies; Dental implants, failure; Microscopy, electron, scanning; Osseointegration; Peri implant diseases; Titanium; X rays, spectrometry, energy dispersive

Indexed keywords

ALUMINUM; BIOMATERIAL; CALCIUM; CARBON; OXYGEN; SILICON; TITANIUM;

EID: 23044506508     PISSN: 00223492     EISSN: None     Source Type: Journal    
DOI: 10.1902/jop.2005.76.7.1092     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.