FTIR studies of tungsten carbide in bulk material and thin film samples

Materials Characterization

Volumn 50, Issue 4-5, 2003, Pages 255-259

  Hoffmann, P ^a   Galindo, H ^a   Zambrano, G ^b   Rincon C ^b   Prieto, P ^b  

^a UNIVERSIDAD DE LOS ANDES   (Venezuela)

^b UNIVERSIDAD DEL VALLE   (Colombia)

Author keywords

FTIR; Hard coatings; Infrared; Tungsten carbide

Indexed keywords

FILM GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; NANOSTRUCTURED MATERIALS; STOICHIOMETRY; THERMAL CONDUCTIVITY; TUNGSTEN CARBIDE; X RAY DIFFRACTION;

COMPOSITE COATINGS; ELECTRON CLOUDS; HARD COATINGS; OPTICAL SPECTROSCOPY;

THIN FILMS;

EID: 22944473663     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(03)00100-1     Document Type: Article

References (14)

1. Kramer BM, Judd PK. Computational design of wear coatings. J Vac Sci Technol, A 1985;3(6):2439-44.
2. Minyoung L. High temperature hardness of tungsten carbide. Metall Trans, A 1983;14A:1625-9.
3. Voevodin AA, O'Neill JP, Prasad SU, Zabinski JS. Nanocrystalline WC and WC/a-C composite coatings procedure from intersected plasma fluxes at low deposition temperatures. J Vac Sci Technol, A 1999;17(3):986-92.
4. Exner HE. Tungsten carbide review paper. Int Metall Rev 1979;4:149-72.
5. Matthesiss LF, Hamann DR. Bulk and surface electronic structure of hexagonal WC. Phys Rev, B 1984;30:1731-8.
6. CRC Materials Science and Engineering Handbook. Boca Raton, London, New York, Washington D.C.: CRC Press; 2001. p. 279.
7. Dekempeneer EHA, Meneve J, Kuypers S, Smeets J. Tribological properties of r.f, PACVD amorphous B-N-C coatings. Thin Solid Films 1996;281-282:331-3.
8. Scherubl T, Thomas LK. Characterization of oxide scales on coatings for gas-turbine blades by infrared reflection-absortion spectroscopy. Fresenius J Anal Chem 1994;394:216-9.
9. Beghi MG, Bottani CE. Vibrational spectroscopy of mixed hexagonal-cubic boron nitride thin films. Thin Solid Films 1997;308-309:107-12.
10. Zambrano G, Rincón C, Prieto P, Galindo H. Hardness and morphological characterization of tungsten carbide thin films. Surf Coat Technol 1998;108-109:323-7.
11. JCPDS Data Cards, (International Center of Diffraction Data. Swarthmore, PA, 1988). Card Numbers 20-1314, 20-1316 and 72-0097.
12. Bullot J, Schmit MP. Physics of amorphous silicon-carbon. Phys Rev, B Solid State 1987;143(2):345-418.
13. Okada T, Yamada S, Takeuchi Y, Wada T. Formation of carbon nitrade films with high N/C ratio by high-pressure radio frequency magneton sputtering. J Appl Phys 1995;78(12):7416-8.
14. Rouzaud JN, Oberlin A, Benybass C. Carbon films - structure and microtexture (optical and electron-microscopy, Raman spectroscopy). Thin Solid Films 1983;105:75-96.