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Volumn 57, Issue 6, 2005, Pages 38-42

Solidification shrinkage defects in electronic solders

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DISSOLUTION; EUTECTICS; LEAD ALLOYS; PHASE COMPOSITION; SHRINKAGE; SOLDERED JOINTS; SOLIDIFICATION; SUBSTRATES; SURFACE ROUGHNESS; TIN ALLOYS;

EID: 22944451466     PISSN: 10474838     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11837-005-0134-x     Document Type: Review
Times cited : (17)

References (14)
  • 1
    • 22944462201 scopus 로고    scopus 로고
    • "Second European Soldering Technology Roadmap"
    • Uxbridge, Middx, U.K.: SOLDERTEC, February
    • K. Nimmo, "Second European Soldering Technology Roadmap," Soldertec (Tin Technology) (Uxbridge, Middx, U.K.: SOLDERTEC, February 2003), http://tsc.jeita.or.jp/TSC/COMMS/7_EASM/english/ leadfree/data/eu_roadmap_2003_ver2.pdf.
    • (2003) Soldertec (Tin Technology)
    • Nimmo, K.1
  • 2
    • 21044433804 scopus 로고    scopus 로고
    • "Real Life Tin Silver Copper Alloy Processing"
    • Bannockburn, IL: IPC-Association Connecting Electronics Industries, CD-ROM- S17-1-1
    • A. Rae, J. Belmonte, and L. Hozer, "Real Life Tin Silver Copper Alloy Processing," Proceedings of APEX Exhibition & Conference 2003 (Bannockburn, IL: IPC-Association Connecting Electronics Industries, 2003, CD-ROM- S17-1-1.)
    • (2003) Proceedings of APEX Exhibition & Conference 2003
    • Rae, A.1    Belmonte, J.2    Hozer, L.3
  • 3
    • 21044446730 scopus 로고    scopus 로고
    • "NEMI Group recommends Tin/Silver/Copper Alloy as Industry Standard for Lead-Free Solder Reflow in Board Assemblies"
    • NEMI-Press Release, Herndon, VA: Int. Electronics Manufacturing Initiative, January
    • J. Mcelroy, "NEMI Group recommends Tin/Silver/Copper Alloy as Industry Standard for Lead-Free Solder Reflow in Board Assemblies," NEMI-Press Release (Herndon, VA: Int. Electronics Manufacturing Initiative, January 2000).
    • (2000)
    • Mcelroy, J.1
  • 4
    • 0032478374 scopus 로고    scopus 로고
    • "Mechanism of Lift Off Phenomenon"
    • K. Suganuma et al., "Mechanism of Lift Off Phenomenon," Scripta Materialia, 38 (1998), pp. 1333-1340.
    • (1998) Scripta Materialia , vol.38 , pp. 1333-1340
    • Suganuma, K.1
  • 6
    • 22944453524 scopus 로고    scopus 로고
    • "IPC 610 Rev D- Requirements for Soldered Electrical and Electronic Assemblies"
    • Bannockburn, IL: IPC, February
    • "IPC 610 Rev D- Requirements for Soldered Electrical and Electronic Assemblies" (Bannockburn, IL: IPC, February 2005).
    • (2005)
  • 7
    • 0035386728 scopus 로고    scopus 로고
    • "Calculation of Phase Equilibria in Candidate Solder Alloys"
    • July, www.metallurgy.nist.gov/phase/papers/ZM-CandidateSolder.pdf
    • U. Kattner and C. Handwerker, "Calculation of Phase Equilibria in Candidate Solder Alloys," Z. Metallkd., 92 (July 2001), www.metallurgy.nist.gov/phase/papers/ZM-CandidateSolder.pdf.
    • (2001) Z. Metallkd. , vol.92
    • Kattner, U.1    Handwerker, C.2
  • 8
    • 22944459717 scopus 로고    scopus 로고
    • "How & Why Solder Bumps Wrinkle after Reflow on a PBGA"
    • Alpharetta, GA: Cookson Electronics, www.cooksonsemi.com/pdfs/ How%20&%20Why%20Bumps%20Wrinkle_2002.pdf
    • D. Lang, "How & Why Solder Bumps Wrinkle after Reflow on a PBGA," Spheres Applications Bulletin (Alpharetta, GA: Cookson Electronics, 2002), www.cooksonsemi.com/pdfs/ How%20&%20Why%20Bumps%20Wrinkle_2002.pdf.
    • (2002) Spheres Applications Bulletin
    • Lang, D.1
  • 9
    • 22944447573 scopus 로고    scopus 로고
    • "Lead Free Wave Soldering"
    • Presentation at NEMI RoHS/Pb-Free Summit, Louisville, CO, October
    • U. Marquez, "Lead Free Wave Soldering" (Presentation at NEMI RoHS/Pb-Free Summit, Louisville, CO, October 2004).
    • (2004)
    • Marquez, U.1
  • 10
    • 3242762363 scopus 로고    scopus 로고
    • "The Observation and Simulation of Sn-Ag-Cu Solder Solidification in Chip-Scale Packaging"
    • K. Kim et al., "The Observation and Simulation of Sn-Ag-Cu Solder Solidification in Chip-Scale Packaging," JOM, 56 (6) (2004), pp. 39-42.
    • (2004) JOM , vol.56 , Issue.6 , pp. 39-42
    • Kim, K.1
  • 11
    • 22944478483 scopus 로고    scopus 로고
    • "NIST Research in Lead Lead-Free Solders: Free Solders: Properties, Processing, Reliability Properties, Processing, Reliability"
    • UC SMART, September
    • C. Handwerker, "NIST Research in Lead Lead-Free Solders: Free Solders: Properties, Processing, Reliability Properties, Processing, Reliability," UC SMART, September 2002.
    • (2002)
    • Handwerker, C.1
  • 12
    • 22944459351 scopus 로고    scopus 로고
    • "Lead-free Soldering - Worlds Apart?"
    • EP&P (now merged with Semiconductor International), Oak Brook, IL: Semiconductor International, August
    • B. Richards, "Lead-free Soldering - Worlds Apart?" EP&P (now merged with Semiconductor International) (Oak Brook, IL: Semiconductor International, August 2001).
    • (2001)
    • Richards, B.1
  • 13
    • 0034297367 scopus 로고    scopus 로고
    • "Copper Substrate Dissolution in Eutectic Sn-Ag Solder and its Effect in Microstructure"
    • S. Chada et al., "Copper Substrate Dissolution in Eutectic Sn-Ag Solder and its Effect in Microstructure," J. Electronic Materials, 29 (10) (2000), pp. 1214-1221.
    • (2000) J. Electronic Materials , vol.29 , Issue.10 , pp. 1214-1221
    • Chada, S.1
  • 14
    • 22944474757 scopus 로고    scopus 로고
    • Personal conversation with Paul Vianco, Sandia National Laboratories, New Mexico
    • Personal conversation with Paul Vianco, Sandia National Laboratories, New Mexico (2005).
    • (2005)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.