Solid C58 films

Physical Chemistry Chemical Physics

Volumn 7, Issue 14, 2005, Pages 2816-2820

  Böttcher, Artur ^a   Weis, Patrick ^a   Jester, Stefan S ^a   Löffler, Daniel ^a   Bihlmeier, Angela ^a   Klopper, Wim ^a   Kappes, Manfred M ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FULLERENE C60; FULLERENE DERIVATIVE; GRAPHITE;

ARTICLE; ATOMIC FORCE MICROSCOPY; BIOMEDICAL ENGINEERING; CHEMISTRY; COMPARATIVE STUDY; DIMERIZATION; ELECTRONICS; KINETICS; SPECTROPHOTOMETRY; TEMPERATURE;

BIOMEDICAL ENGINEERING; DIMERIZATION; ELECTRONICS; FULLERENES; GRAPHITE; KINETICS; MICROSCOPY, ATOMIC FORCE; SPECTROPHOTOMETRY; TEMPERATURE;

EID: 22844432345     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/b505703e     Document Type: Article

References (35)

1. H. W. Kroto, J. R. Heath, S. C. O'Brien, R. F. Curl and R. E. Smalley, Nature, 1985, 318, 162.
2. M. S. Dresselhaus, P. C. Eklund and G. Dresselhaus, Fullerenes and Nanotubes, in Carbon Materials for Advanced Technologies. ed. T. D. Burchell, Elsevier, Amsterdam, 1996.
3. W. Krätschmer, L. D. Lamb, K. Fostiropoulos and D. R. Huffmann, Nature, 1990, 347, 354.
4. Fullerene Patent Database at http://www.godunov.com/Bucky patents.html.
5. (a) R. Seidel, M. Liebau, G. S. Duesberg, F. Kreupl, E. Unger, A. P. Graham, W. Hoenlein and W. Pompe, Nano Lett., 2003, 3, 965:
6. (b) W. Höhnlein, F. Kreupl, G. S. Duesberg, A. P. Graham, M. Liebau, R. Seidel and R. Unger, Mater. Sci. Eng., C, 2003, 23, 663.
7. R. Krupke, F. Hennrich. H. von Löhneysen and M. M. Kappes, Science, 2004, 388, 344.
8. M. D. Diener and J. M. Alford, Nature, 1998, 393, 668.
9. R. Taylor, J. P. Hare, A. Abdul-Sada and H. W. Kroto, J. Chem. Soc., Chem. Commun., 1990, 20, 1423.
10. P. W. Fowler and D. E. Manolopoulos, An Atlas of Fullerenes, Clarendon Press, Oxford, 1995.
11. A. Böttcher, P. Weis, A. Bihlmeier and M. M. Kappes, Phys. Chem. Chem. Phys., 2004, 13, 5213.
12. T. Greber, Surf. Sci. Rep., 1997, 28, 3.
13. B. Tsipinyuk, A. Budrevich, M. Grinberg and E. Kolodney, J. Chem. Phys., 1996, 106, 2449.
14. S. Diaz-Tendero, M. Alcami and F. Martin, J. Chem. Phys., 2003, 119, 5545.
15. R. C. Haddon, Science, 1993, 26, 1545.
16. (a) P. A. Redhead, Vacuum, 1962, 12, 203;
17. (b) A. M. de Jong and J. W. Niemantsverdriet, Surf. Sci., 1990, 233, 355.
18. L. A. Girifalco, M. Hodak and R. S. Lee, Phys. Rev., 2000, 62, 13104.
19. H. Ulbricht, G. Moos and T. Hertel, Phys. Rev. Lett., 2003, 90, 95501.
20. D. Sarid, Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces, Oxford University Press, Oxford, 1991.
21. P. Meakin, J. Chem. Phys., 1983, 79, 2426.
22. P. A. Gravil, M. Devel, Ph. Lambin, X. Bouju, Ch. Girard and A. A. Lucas, Phys. Rev. B, 1996, 53, 1622.
23. (a) G.-W. Wang, K. Komatsu, Y. Murata and M. Shiro, Nature, 1997, 387, 583;
24. (b) P. Nagel, V. Pasler, S. Lebedkin, A. Soldatov, C. Meingast, B. Sundqvist, P.-A. Persson, T. Tanaka, K. Komatsu, S. Buga and A. Inaba, Phys. Rev. B, 1999, 60, 16920.
25. D. J. van den Heuvel, I. Y. Chan, E. J. J. Groenen, M. Matsushita, J. Schmidt and G. Meijer, Chem. Phys. Lett., 1995, 233, 284.
26. J. Onoe, T. Nakayama, M. Aono and T. Hara, Appl. Phys. Lett., 2003, 82, 595.
27. S. Okada and S. Saito, Phys. Rev. B, 1999, 59, 1930.
28. (a) A. J. Du, Z. Y. Pan, Y. K. Ho, Z. Huang and Z. X. Zhang, Phys. Rev. B, 2002, 66, 35405;
29. (b) A. J. Du, Z. Y. Pan, Z. Huang, Z. J. Li, Q. Wei and Z. X. Zhang, Int. J. Mod. Phys. B, 2002, 16, 3971.
30. X. Lu, Z. Chen, W. Thiel, P. von R. Schleyer, R. Huang and L. Zheng, J. Am. Chem. Soc., 2004, 126, 14871.
31. Z. Klusek, Appl. Surf. Sci., 1998, 125, 339.
32. B. Yoon, V. M. Akulin, Ph. Cahuzac, F. Carlier, M. de Frutos, A. Masson, C. Mory, C. Colliex and C. Brechignac, Surf. Sci., 1999, 443, 76.
33. A. Bihlmeier, C. C. Samson and W. Klopper, submitted.
34. (a) N. Troullier and J. L. Martins, Phys. Rev. B, 1993, 46, 1759;
35. (b) M. S. Golden, M. Knupfer, J. Fink, J. F. Armbruster, T. R. Cummins, H. A. Romberg, M. Roth, M. Sing, M. Schmidt and E. Sohmen, J. Phys.: Condens. Matter, 1995, 7, 8219.