Scanning tunneling microscopy and spectroscopy of the thermally oxidized (0001) basal plane of highly oriented pyrolitic graphite

Applied Surface Science

Volumn 125, Issue 3-4, 1998, Pages 339-350

  Klusek, Z ^a  

^a UNIVERSITY OF LODZ   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TUNNELING; ELECTRONIC DENSITY OF STATES; SCANNING TUNNELING MICROSCOPY; THERMOOXIDATION;

HIGHLY ORIENTED PYROLITIC GRAPHITE (HOPG);

GRAPHITE;

EID: 0032025280     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00500-X     Document Type: Article

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