Two-point separation in far-field super-resolution fluorescence microscopy based on two-color fluorescence dip spectroscopy, Part I: Experimental evaluation

Applied Spectroscopy

Volumn 59, Issue 7, 2005, Pages 868-872

  Watanabe, Takeshi ^a   Iketaki, Yoshinori ^b   Omatsu, Takashige ^c   Yamamoto, Kimihisa ^d   Fujii, Masaaki ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b OLYMPUS CORPORATION   (Japan)

^c CHIBA UNIVERSITY   (Japan)

^d KEIO UNIVERSITY   (Japan)

Author keywords

Far field fluorescence microscopy; Super resolution microscopy; Two color fluorescence dip spectroscopy; Two point resolution

Indexed keywords

FAR-FIELD FLUORESCENCE MICROSCOPY; LASER SCANNING MICROSCOPY (LSM); SUPER-RESOLUTION MICROSCOPY; TWO-COLOR FLUORESCENCE DIP SPECTROSCOPY; TWO-POINT RESOLUTION;

COLOR; DIFFRACTION; FLUORESCENCE; IMAGE ANALYSIS; LASER BEAMS; PHASE MODULATION; RAYLEIGH SCATTERING; SEPARATION;

MICROSCOPIC EXAMINATION;

FLUORESCENT DYE; NANOTUBE;

ARTICLE; EVALUATION; IMAGE ENHANCEMENT; INSTRUMENTATION; LASER; METHODOLOGY; MULTIPHOTON MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

FLUORESCENT DYES; IMAGE ENHANCEMENT; LASERS; MICROSCOPY, FLUORESCENCE, MULTIPHOTON; NANOTUBES; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 22744436181     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702054411562     Document Type: Article

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