Scanning tunneling microscopy tip shape imaging by "shadowing": Monitoring of in situ tip preparation

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 17, Issue 2, 1999, Pages 294-296

  Voigtländer, Bert ^a   Kästner, Martin ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22644452781     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590659     Document Type: Article

References (13)

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10. In this case, Sb was evaporated to generate the shadow image. Sb leads to a larger smearing of the shadow edges (M. Kästner and B. Voigtlander, unpublished).
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