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Volumn 50, Issue 21, 2005, Pages 4297-4307

Ab initio derivation of the electronic structure properties across the Cu-Cu2O interface

Author keywords

Charge transport; Cu Cu2O interface; Density functional theory; Electronic structure; Schottky barrier

Indexed keywords

CHARGE TRANSFER; CHEMICAL BONDS; COPPER COMPOUNDS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; MATHEMATICAL MODELS; PROBABILITY DENSITY FUNCTION;

EID: 22644444056     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2005.03.072     Document Type: Conference Paper
Times cited : (5)

References (33)
  • 11
    • 2442516792 scopus 로고    scopus 로고
    • Corrosion science: A retrospective and current status
    • G. Frankel, J.R. Scully, H.S. Isaacs, J.D. Sinclair (Eds.) In Honor of R. Frankenthal Philadelphia, PA
    • O.L. Blajiev, A. Hubin, C. Buess-Herman, in: G. Frankel, J.R. Scully, H.S. Isaacs, J.D. Sinclair (Eds.), Corrosion Science: A Retrospective and Current Status, In Honor of R. Frankenthal, ECS Meeting, Philadelphia, PA, 2002, p. 485.
    • (2002) ECS Meeting , pp. 485
    • Blajiev, O.L.1    Hubin, A.2    Buess-Herman, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.