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Volumn 79, Issue 3-4, 2005, Pages 186-193
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Zirconium nitride/nickel nanocomposite structures
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Author keywords
Ellipsometry; Nanocomposites; Nitrides; Sputtering; X ray photoelectron spectroscopy
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Indexed keywords
AMORPHOUS MATERIALS;
COMPOSITION;
ELLIPSOMETRY;
HARDNESS TESTING;
MAGNETRON SPUTTERING;
NICKEL COMPOUNDS;
NITRIDES;
PHASE COMPOSITION;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
FILM STRUCTURE;
NANOHARDNESS;
OPTICAL CONSTANTS;
SPECTROSCOPIC ELLIPSOMETRY;
NANOSTRUCTURED MATERIALS;
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EID: 22544479163
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2005.04.001 Document Type: Article |
Times cited : (9)
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References (16)
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