Advanced resonant ultrasound spectroscopy for measuring anisotropic elastic constants of thin films

Fatigue and Fracture of Engineering Materials and Structures

Volumn 28, Issue 8, 2005, Pages 657-663

  Ogi, Hirotsugu ^a   Nakamura, N ^a   Hirao, M ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Elastic constants; Laser Doppler interferometry; Micromechanics modelling; Resonance ultrasound spectroscopy; Thin film

Indexed keywords

ANISOTROPY; COMPOSITE MICROMECHANICS; COPPER; DIAMONDS; ELASTICITY; FILM GROWTH; INTERFEROMETRY; LASER APPLICATIONS; NATURAL FREQUENCIES; PIEZOELECTRIC DEVICES; SPECTROSCOPY; THIN FILMS;

ELASTIC CONSTANTS; LASER DOPPLER INTERFEROMETRY; MICROMECHANICS MODELLING; RESONANCE ULTRASOUND SPECTROSCOPY;

POLYCRYSTALLINE MATERIALS;

EID: 22544464146     PISSN: 8756758X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1460-2695.2005.00885.x     Document Type: Article

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