Elastic constants of chemical-vapor-deposition diamond thin films: Resonance ultrasound spectroscopy with laser-Doppler interferometry

Acta Materialia

Volumn 52, Issue 3, 2004, Pages 765-771

  Nakamura, Nobutomo ^a   Ogi, Hirotsugu ^a   Hirao, Masahiko ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Acoustic methods; Carbon and graphite; Elastic behavior; Micromechanical modeling; Resonance ultrasound spectroscopy; Thin Films

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; CHEMICAL BONDS; CHEMICAL VAPOR DEPOSITION; DIAMONDS; DOPPLER EFFECT; GRAIN BOUNDARIES; INTERFEROMETRY; LASER APPLICATIONS; MICROCRACKS; NATURAL FREQUENCIES; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; VOLUME FRACTION;

ELASTIC CONSTANTS; RESONANCE ULTRASOUND SPECTROSCOPY (RUS);

THIN FILMS;

EID: 1642478985     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2003.10.012     Document Type: Article

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