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Volumn 41, Issue 4, 1999, Pages 443-448

Young's modulus of silver films

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE FILMS; ELASTIC MODULI; MULTILAYERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; THICKNESS MEASUREMENT;

EID: 0032688832     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(99)00175-X     Document Type: Article
Times cited : (42)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.