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Volumn 41, Issue 4, 1999, Pages 443-448
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Young's modulus of silver films
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CONDUCTIVE FILMS;
ELASTIC MODULI;
MULTILAYERS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON;
THICKNESS MEASUREMENT;
SILVER FILMS;
METALLIC FILMS;
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EID: 0032688832
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(99)00175-X Document Type: Article |
Times cited : (42)
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References (16)
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