Some considerations on system burn-in

IEEE Transactions on Reliability

Volumn 54, Issue 2, 2005, Pages 207-214

  Kim, Kyungmee O ^a   Kuo, Way ^b  

^a Konkuk University   (South Korea)

^b UNIVERSITY OF TENNESSEE   (United States)

Author keywords

Assembly quality; Nonhomogeneous Poisson process; Renewal process

Indexed keywords

FAILURE ANALYSIS; MATHEMATICAL MODELS; POISSON DISTRIBUTION; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES; THEOREM PROVING;

ASSEMBLY QUALITY; NONHOMOGENEOUS POISSON PROCESS; RENEWAL PROCESS; SYSTEM RELIABILITY;

RELIABILITY THEORY;

EID: 22444432778     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2005.847275     Document Type: Article

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