Engineering nanocrystals of silicon

Molecular Simulation

Volumn 31, Issue 6-7, 2005, Pages 405-410

  Cornish, John C L ^a   Mohamed, Eman ^a   Abdelaal, Reem ^a  

^a MURDOCH UNIVERSITY   (Australia)

Author keywords

Anisotropic etching; Crystalline fraction; Silicon; Thin films

Indexed keywords

AMORPHOUS SILICON; ANISOTROPY; CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; ETCHING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; OPTOELECTRONIC DEVICES; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY; VOLUME FRACTION;

ANISOTROPIC ETCHING; BAND GAP ENERGY; BLUE SHIFT; CRYSTALLINE FRACTION;

NANOSTRUCTURED MATERIALS;

EID: 22144476519     PISSN: 08927022     EISSN: None     Source Type: Journal    
DOI: 10.1080/08927020412331332695     Document Type: Conference Paper

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