Strongly temperature-dependent free-energy barriers measured in a polycrystalline semiconductor

Applied Physics Letters

Volumn 86, Issue 26, 2005, Pages 1-3

  Young, David L ^a   Crandall, Richard S ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CAPACITANCE; COPPER COMPOUNDS; ELECTRON EMISSION; ELECTRON TRANSITIONS; ENTROPY; POLYCRYSTALLINE MATERIALS; SEMICONDUCTOR MATERIALS;

CARRIER EMISSION; FREE-ENERGY BARRIERS; POLYCRYSTALLINE SEMICONDUCTORS; TEMPERATURE DEPENDENCES;

FREE ENERGY;

EID: 22144433014     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1977211     Document Type: Article

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