Novel approach to microcrack-free thick YBa2Cu3O 7-δ films on r-cut sapphire buffered with CeO2

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART III, 2005, Pages 2958-2961

  Nie, Jia Cai ^a,b   Yamasaki, Hirofumi ^a   Nakagawa, Yoshihiko ^a   Develos Bagarinao, Katherine ^a   Murugesan, Mariappan ^a   Obara, Haruhiko ^a   Mawatari, Yasunori ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b BEIJING NORMAL UNIVERSITY   (China)

Author keywords

Critical current density; Deliberately miscut sapphire; Microcrack free; Thick YBCO film

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUFFER STORAGE; CERIUM COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); MICROCRACKING; PULSED LASER DEPOSITION; SAPPHIRE; YTTERBIUM COMPOUNDS;

DELIBERATELY MISCUT SAPPHIRE; FILM THICKNESS; MICROCRACK-FREE; THICK YBCO FILMS;

THICK FILMS;

EID: 22144432981     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.848681     Document Type: Conference Paper

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