Factors affecting the microwave surface resistance of crack-free thick YBCO films on sapphire substrates

Physica C: Superconductivity and its Applications

Volumn 392-396, Issue PART 2, 2003, Pages 1236-1240

  Kawagishi, K ^a   Komori, K ^a   Fukutomi, M ^a   Togano, K ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Carrier density; Microwave surface resistance; RF magnetron sputtering; Sapphire; YBCO

Indexed keywords

CRACK PROPAGATION; HALL EFFECT; MAGNETRON SPUTTERING; MICROWAVE DEVICES; SAPPHIRE; STOICHIOMETRY; SUPERCONDUCTING FILMS; SURFACE PHENOMENA;

SURFACE RESISTANCE;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0042785082     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(03)01025-6     Document Type: Conference Paper

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