NDE of defects in superconducting wires using SQUID microscopy

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART I, 2005, Pages 707-710

  Lee, Su Young ^a   Viswanathan, V ^a   Huckans, J ^a   Matthews, J ^a   Wellstood, F C ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

MRI; NDE; SQUID; Superconducting wire

Indexed keywords

DEFECTS; INSULATING MATERIALS; INTEGRATED CIRCUITS; MAGNETIC FIELDS; MAGNETIC RESONANCE IMAGING; MICROSCOPIC EXAMINATION; NIOBIUM; NONDESTRUCTIVE EXAMINATION; SQUIDS;

CURRENT INJECTION; NON-DESTRUCTIVE EVALUATION (NDE); OCCLUSIONS; SQUID MICROSCOPY;

SUPERCONDUCTING WIRE;

EID: 22044443444     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.850020     Document Type: Conference Paper

References (8)

1. S. Chatraphorn, E. F. Fleet, and F. C. Wellstood, "Scanning SQUID microscopy of integrated circuits," Appl. Phys. Lett., vol. 76, pp. 2304-2306, 2000.
2. c scanning SQUID microsocpe," IEEE. Trans. Appl. Supercon., vol. 11, pp. 215-218, 2001.
3. J. P. Wikswo Jr, "SQUID Magnetometers for studying corrosion and corrosion protection in aircraft aluminum," NACE Int., vol. 293, p. 1, 1997.
4. c superconducting quantum interference device microscope," J. Appl. Phys., vol. 89, pp. 1977-1979, 2001.
5. Wire Samples Were Provided by IGC Advanced Superconductors, Thomaston Ave., Waterbury, CT 06704, 1875.
6. S.-Y. Lee, "Multi-Channel Scanning SQUID Microscopy," Ph.D. Thesis, University of Maryland, 2004.
7. PFL-100 (FLL electronics) and PCI-1000 (PFL controller), Star Cryoelectronics. [Online] http://www.starcryo.com
8. H. Weinstock, N. Tralshwala, and J. R. Claycomb, "Nondestructive evaluation of wires using high-temperature SQUIDs," IEEE Trans. Appl. Supercond., vol. 9, pp. 3797-3800, 1999.