Imaging defects in Cu-clad NbTi wire using a high-Tc scanning SQUID microscope

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 215-218

  Fleet, E ^a   Gilbertson, A ^a   Chatraphorn, S ^a   Tralshawala, N ^b,c   Weinstock, H ^d   Wellstood, F C ^a  

^a University of Maryland   (United States)

^b RAYTHEON COMPANY   (United States)

^c NASA GODDARD SPACE FLIGHT CENTER   (United States)

^d AIR FORCE OFFICE OF SCIENTIFIC RESEARCH   (United States)

Author keywords

Non destructive evaluation; SQUID; Superconducting; Wires

Indexed keywords

COPPER; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC FIELDS; MAGNETIC VARIABLES MEASUREMENT; MICROSCOPES; NIOBIUM COMPOUNDS; NITROGEN; NONDESTRUCTIVE EXAMINATION; SAPPHIRE; SUPERCONDUCTING WIRE; YTTRIUM BARIUM COPPER OXIDES;

HIGH TEMPERATURE SCANNING SQUID MICROSCOPE; IMAGING DEFECTS;

SQUIDS;

EID: 0035268834     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919322     Document Type: Conference Paper

References (10)

1. Magnetic microscopy using a liquid nitrogen cooled YBCO SQUID
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3. 7
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6. c SQUIDs