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Volumn 54, Issue 1, 2005, Pages 527-530
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Dynamics and control of tapping tip in atomic force microscope for surface measurement applications
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Author keywords
Atomic force microscopy (AFM); Nonlinear dynamics; Tapping mode
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Indexed keywords
ADHESION;
DYNAMICS;
NANOTECHNOLOGY;
PARAMETER ESTIMATION;
POLYMERS;
RESONANCE;
STABILITY;
SURFACE MEASUREMENT;
SCANNERS;
SCANNING PROBE MICROSCOPES;
TAPPING MODES;
TAPPING RESPONSE;
ATOMIC FORCE MICROSCOPY;
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EID: 21944442769
PISSN: 00078506
EISSN: None
Source Type: Journal
DOI: 10.1016/S0007-8506(07)60161-9 Document Type: Article |
Times cited : (4)
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References (8)
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