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Volumn 54, Issue 1, 2005, Pages 527-530

Dynamics and control of tapping tip in atomic force microscope for surface measurement applications

Author keywords

Atomic force microscopy (AFM); Nonlinear dynamics; Tapping mode

Indexed keywords

ADHESION; DYNAMICS; NANOTECHNOLOGY; PARAMETER ESTIMATION; POLYMERS; RESONANCE; STABILITY; SURFACE MEASUREMENT;

EID: 21944442769     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)60161-9     Document Type: Article
Times cited : (4)

References (8)
  • 1
    • 0030418209 scopus 로고    scopus 로고
    • Progress in 3D surface microtopography characterization
    • Lonardo, P. M., Trumpold, H., De Chiffre, L., 1996, Progress in 3D surface microtopography characterization, Annals of the CIRP, 45/2:589-598.
    • (1996) Annals of the CIRP , vol.45 , Issue.2 , pp. 589-598
    • Lonardo, P.M.1    Trumpold, H.2    De Chiffre, L.3
  • 2
    • 0032689328 scopus 로고    scopus 로고
    • Surface topology characterization using an atomic force microscope mounted on a coordinate measuring machine
    • De Chiffre, L., Hansen, H. N., Kofod, N., 1999, Surface topology characterization using an atomic force microscope mounted on a coordinate measuring machine, Annals of the CIRP, 48/2:463-466.
    • (1999) Annals of the CIRP , vol.48 , Issue.2 , pp. 463-466
    • De Chiffre, L.1    Hansen, H.N.2    Kofod, N.3
  • 3
    • 0013010043 scopus 로고    scopus 로고
    • Calibration and industrial application of instrument for surface mapping based on AFM
    • Hansen, H. N., Kofod, N., De Chiffre, L., Wanheim, T., 2002, Calibration and industrial application of instrument for surface mapping based on AFM, Annals of the CIRP, 51/1:471-474.
    • (2002) Annals of the CIRP , vol.51 , Issue.1 , pp. 471-474
    • Hansen, H.N.1    Kofod, N.2    De Chiffre, L.3    Wanheim, T.4
  • 4
    • 0000583552 scopus 로고    scopus 로고
    • Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy
    • Garcia, R., San Paulo, A., 1999, Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy, Physical Review B, 60:4961-4967.
    • (1999) Physical Review B , vol.60 , pp. 4961-4967
    • Garcia, R.1    San Paulo, A.2
  • 5
    • 0038599782 scopus 로고    scopus 로고
    • Nonlinear dynamics of microcantilevers in tapping mode atomic force microscopy: A comparison between theory and experiment
    • Lee, S. I., Howell, S. W., Raman, A., Reifenberger, R., 2002, Nonlinear dynamics of microcantilevers in tapping mode atomic force microscopy: a comparison between theory and experiment, Physical Review B, 66:115409.
    • (2002) Physical Review B , vol.66 , pp. 115409
    • Lee, S.I.1    Howell, S.W.2    Raman, A.3    Reifenberger, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.