Application of scanning thermal microscopy: Mapping near field light-emission of a QW laser diode in operation

Materials Science and Engineering A

Volumn 292, Issue 2, 2000, Pages 179-182

  Xie, Zhigang ^a   Han, Li ^a   Wei, Feng ^a   Wang, Xiufeng ^a   Gu, Yuqin ^a   Chen, Haoming ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT CONDUCTION; INFRARED IMAGING; LIGHT EMISSION; QUANTUM WELL LASERS; THERMAL EXPANSION;

SCANNING THERMAL MICROSCOPY;

SCANNING TUNNELING MICROSCOPY;

EID: 0034326013     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)01007-8     Document Type: Article

References (3)

1. E. Gmelin R. Fischer R. Stitzinger Thermochim. Acta 310 1998 1
2. A. Hammiche H.M. Pollock M. Song D.J. Hourston Meas. Sci. Technol. 7 1996 142
3. K. Luo Z. Shi J. Varesi A. Majumdar J. Vac. Sci. Technol. B 15 2 1997 349