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Volumn 27, Issue , 2003, Pages 141-155

Process and material challenges associated with the next generation of LTCC based products

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SYSTEMS; HIGH FREQUENCY CIRCUITS; LOW TEMPERATURE COFIRED CERAMICS (LTCC); TAPE INSTABILITY;

EID: 21644479212     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (10)
  • 8
    • 0010950049 scopus 로고    scopus 로고
    • Is buried better? -Evaluation the performance of buried resistors in LTCCs
    • March /April
    • Heiko Thust, Karl-heinz Drue, Torsten Thelemann, Erich K. Polzer, and Jens Muller, "Is Buried Better? -Evaluation the Performance of Buried Resistors in LTCCs," Advanced Packaging, March /April, pp. 40-46, 1998.
    • (1998) Advanced Packaging , pp. 40-46
    • Thust, H.1    Drue, K.-H.2    Thelemann, T.3    Polzer, E.K.4    Muller, J.5
  • 9
    • 0002042526 scopus 로고    scopus 로고
    • Characterization and performance prediction for integral resistors in low temperature cofired ceramic technology
    • February
    • Kieran Denlaney, John Barrett, John Barton, and Rory Doyle, "Characterization and Performance Prediction for Integral Resistors in Low Temperature Cofired Ceramic technology," IEEE Transactions on Advanced Packaging, Vol. 22, No. 1, pp. 78-85, February, 1999.
    • (1999) IEEE Transactions on Advanced Packaging , vol.22 , Issue.1 , pp. 78-85
    • Denlaney, K.1    Barrett, J.2    Barton, J.3    Doyle, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.