Characteristics of nano-thickness lead zirconate titanate thin film for high-density storage applications

Materials Science and Engineering: B

Volumn 122, Issue 1, 2005, Pages 12-19

  Kim, Chang Jung ^a   Lee, Yong Kyun ^b  

^a Korea Institute of Ceramic Engineering and Technology (KICET)   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

Ferroelectric; Lead zirconate titanate (PZT); Nano thickness thin film; Sol gel method, Lead titanate (PTO) seed layer

Indexed keywords

ELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; NUCLEATION; SOLUTIONS; THICKNESS MEASUREMENT; THIN FILMS; TITANIUM COMPOUNDS; ZIRCON;

LEAD TITANATE (PTO) SEED LAYER; LEAD ZIRCONATE TITANATE (PZT); NANO-THICKNESS THIN FILMS; SOL-GEL METHOD;

LEAD;

EID: 21644454147     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2005.04.025     Document Type: Article

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