AccMon: Automatically detecting memory-related bugs via program counter-based invariants

Proceedings of the Annual International Symposium on Microarchitecture, MICRO

Volumn , Issue , 2004, Pages 269-280

  Zhou, Pin ^a   Liu, Wei ^a   Fei, Long ^b   Lu, Shan ^a   Qin, Feng ^a   Zhou, Yuanyuan ^a   Midkiff, Samuel ^b   Torrellas, Josep ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b Purdue University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHECK LOOK-ASIDE BUFFER (CLB); MICROARCHITECTURES; SOFTWARE BUGS; VALUE-BASED INVARIANCE;

COMPUTER ARCHITECTURE; COMPUTER PROGRAMMING; COMPUTER SOFTWARE; INVARIANCE; LOGIC PROGRAMMING; OBJECT ORIENTED PROGRAMMING; OPTIMIZATION; PERSONAL COMPUTERS; PROGRAM DEBUGGING;

STORAGE ALLOCATION (COMPUTER);

EID: 21644447484     PISSN: 10724451     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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