Atomic force microscopy studies of cubic BC2N, a new superhard phase

Journal of Materials Science

Volumn 40, Issue 11, 2005, Pages 3009-3011

  Zinin, P V ^a   Solozhenko, V L ^b   Malkin, A J ^c   Ming, L C ^a  

^a UNIVERSITY OF HAWAII   (United States)

^b UNIVERSITÉ PARIS 13   (France)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; GRANULAR MATERIALS; NANOSTRUCTURED MATERIALS; PHASE COMPOSITION; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON NITRIDE;

BOND LENGTH; HALL-PETCH EFFECT; HARD MATERIALS; SILICON CANTILEVER;

CUBIC BORON NITRIDE;

EID: 21644440126     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10853-005-2385-x     Document Type: Article

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