First-principles exploration of possible trap terminators in SiO2

Applied Physics Letters

Volumn 73, Issue 8, 1998, Pages 1122-1124

  Yokozawa, Ayumi ^a   Miyamoto, Yoshiyuki ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21544482574     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122103     Document Type: Article

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