High-speed low-voltage built-in current sensor

IEEE International Workshop on IDDQ Testing, Digest of Papers

Volumn , Issue , 1997, Pages 90-94

  Huang, T C ^a   Huang, M C ^a   Lee, K J ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; ELECTRIC CURRENTS; EXPERIMENTS; NETWORKS (CIRCUITS); TESTING;

BUILT-IN CURRENT SENSOR; IDDQ TEST;

SENSORS;

EID: 0031359734     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)